Our state-of-the-art inspection system utilizes a chromatic confocal line sensor combined with advanced 3D and 2D algorithms to deliver sub-micron precision for surgical staple linear anvils. Designed to measure entire trays of samples in-line, the system provides high-resolution depth and surface data, ensuring every part meets quality standards. 

Why Choose Our System? 

• High Throughput: Rapidly inspect full trays of samples without sacrificing accuracy.
• Enhanced Quality Control: Detect even the smallest defects with deep learning, ensuring only perfect parts reach the market.
• Flexible Measurements: Obtain detailed measurements beyond standard XYZ, tailored to your specific needs.
• Data Accessibility: Save and review comprehensive inspection data for traceability and process optimization.
• Seamless Integration: Designed for in-line use, minimizing downtime and maximizing efficiency. 

Key Features 

• Measure XYZ dimensions, including pocket depth, length, width, and true position, with sub-micron accuracy using our chromatic confocal line sensor.
• Custom 2D and 3D algorithms for calculating pocket depth, pocket dimensions, true position.
• Powered by Halcon Deep Learning, the 2D images generated using the intensity channel from the confocal line sensor can be used for defect detections in real time with pass/fail results for each part in a tray.
• Access results through a customized UI designed for easy operator navigation, with data saved as CSV files, point clouds, 3D maps, and 2D images for review.